The SMP passive probe series is specially engineered for efficient and accurate probing of surface-mount (SMD) devices. Its T-shaped body design enables simultaneous contact with multiple rectangular pins spaced at a standard 2.54 mm pitch, making it highly effective for probing across connector headers, test pads, and SMD component arrays.
This series delivers up to 500 MHz bandwidth and is ideal for low-voltage signal analysis. With low input capacitance (as low as 7 pF) and interchangeable spring tips, the SMP series ensures precision and convenience. The TETRIS® inline probing system makes this probe a go-to tool for high-density board analysis and debugging.
The SMP probe can be connected to any oscilloscope with a 1 MΩ input impedance, using its BNC connector. Optional Read-Out (RO) functionality allows automatic attenuation scaling on compatible scopes.
