Home ANRITSU | Bit Error Rate Testers Signal Quality Analyzer-R MP1900A
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ANRITSU | Bit Error Rate Testers

Signal Quality Analyzer-R MP1900A

The Anritsu MP1900A Signal Quality Analyzer-R is a high-performance Bit Error Rate Tester (BERT) designed for testing high-speed network interfaces like NRZ and PAM4, as well as various bus interfaces such as PCI Express and USB. With an 8-slot modular design, it supports comprehensive physical layer measurements for modern data-center interconnects, including 100 GbE, 200 GbE, 400 GbE, PCIe Gen6, and more..

  • Detail
  • Special Features
  • Specification

The MP1900A Signal Quality Analyzer-R is a powerful tool for assessing the integrity of high-speed signals used in data transmission and processing. The device is modular, with eight slots that can be filled with different measurement modules to cater to a variety of testing needs. This makes the MP1900A highly versatile, especially for industries that require comprehensive testing of multiple types of interfaces.

  • Test Coverage: It supports physical layer measurements for a wide range of high-speed interfaces, including 100 GbE, 200 GbE, PCIe Gen6, USB4, Thunderbolt, and others.

  • Signal Integrity Analysis: It can perform both NRZ and PAM4 measurements, providing insight into signal quality, jitter, and noise, which are critical for ensuring reliable data transmission.

  • Flexible and Expandable: With its 8-slot design, the MP1900A can be expanded with additional modules to increase measurement capabilities as required.

  • High-Speed Data Handling: The analyzer supports testing up to speeds of 64 GT/s (PCIe Gen6) and provides support for multi-channel technologies, making it ideal for next-gen networking and interconnects.

The MP1900A is particularly useful for manufacturers and researchers working on advanced data-center equipment, next-gen networking technologies, and high-speed interconnects. It is an ideal solution for testing SERDES, optical modules, and other critical components used in modern communication systems.

  • Modular Design: 8-slot configuration allows for flexible expansion with various modules like PPG, ED, and Jitter/Noise Generator.

  • Wide Interface Support: Supports measurements for 100 GbE, 200 GbE, PCIe Gen6, USB4, Thunderbolt, InfiniBand, SAS-4, and more.

  • All-in-One Measurement: Provides comprehensive signal integrity analyses, covering both NRZ and PAM4 signaling.

  • High-Speed Testing: Capable of handling the latest high-speed interconnects, ensuring compatibility with next-gen technologies like 64 GT/s PCIe Gen6.

  • Jitter and Noise Evaluation: Includes advanced jitter/noise generation capabilities for evaluating signal quality.

  • Targeted Applications: Optimized for testing data-center networks, high-speed interconnects, optical modules, and SERDES interfaces.

  • Modular Slots: 8

  • Supported Interfaces: 100 GbE, 200 GbE, PCI Express Gen1/2/3/4/5/6, USB 3.2/4, SAS-3/4, InfiniBand EDR/HDR, Thunderbolt 1/2/3, DP1.4, AOC

  • Signal Types: NRZ, PAM4

  • Speed Range: Up to 64 GT/s (PCIe Gen6)

  • Measurement Modules: PPG, ED, Jitter/Noise Generator

  • Test Focus: Signal Integrity, Jitter/Noise, Error Rates

  • Application Areas: Data-center networking, high-speed interconnects, optical modules, SERDES testing